Vehicular lighting device

ABSTRACT

A first photosensor is sensitive to the wavelength of excitation light, insensitive to the wavelength of fluorescent light, and receives a portion of the output light to generate a first current corresponding to the amount of light received. A second photosensor is sensitive to the fluorescent light wavelength, insensitive to excitation light wavelength, and receives a portion of the output light to generate a second current corresponding to the received light amount. A first current/voltage conversion circuit outputs a first detection voltage corresponding to the voltage drop across a first resistor. A second current/voltage conversion circuit outputs a second detection voltage corresponding to the voltage drop across a second resistor. If (i) a relation between the magnitudes of the first detection voltage and the second detection voltage has reversed, or (ii) if the first detection voltage deviates from a normal voltage range, a judgment unit asserts an abnormality detection signal.

BACKGROUND OF THE INVENTION 1. Field of the Invention

The present invention relates to vehicular lighting devices employed inautomobiles or the like.

2. Description of the Related Art

Halogen lamps and high intensity discharge (HID) lamps have beenmainstream as vehicle lighting devices, particularly, headlamp lightsources, to date, but in recent years, the development of vehiclelighting devices employing semiconductor light sources such aslight-emitting diodes (LEDs) as an alternative to these devices has beenadvancing. For the sake of further improvement in visibility, vehiclelighting devices furnished with laser diodes (also referred to as“semiconductor lasers”) and phosphors instead of LEDs have beendisclosed (reference is made to Patent Document 1, for example). Withthe technology described in Patent Document 1, ultraviolet light that isexcitation light output from a laser diode is shone onto a phosphor.Receiving the ultraviolet light, the phosphor generates white light. Thewhite light generated by the phosphor is beamed frontward of thelighting device, whereby a predetermined light distribution pattern isformed. With the technology described in Patent Document 1, theexcitation light is beamed.

RELATED ART DOCUMENTS Patent Documents Patent Document 1

Japanese Patent Application Laid Open No. 2004-241142 Patent Document 2

International Publication WO 10/070720 pamphlet

(1) FIG. 1 is a cross-sectional view of a vehicular lighting-devicelight source investigated by the present inventors. The light source 10principally includes a laser diode 12, a phosphor 14, an optical system16, and a housing 18. In terms of being provided with the laser diode 12and the phosphor 14, the light source 10 shares points in common withthe technology in Patent Document 1.

The laser diode 12 shown in FIG. 1 generates blue excitation light 20instead of ultraviolet light. The excitation light 20 is focused on thephosphor 14 by means of the optical system 16. The optical system 16 isconfigured as a lens, reflecting mirror, optical fiber, or a combinationthereof. Upon reception of the blue excitation light 20, the phosphor 14generates fluorescent light 22 having a spectral distribution over awavelength region including wavelengths (green to red) that are longerthan the excitation light 20. The excitation light 20 shone onto thephosphor 14 is scattered by the phosphor 14, and passes through thephosphor 14 in a state in which its coherence has been compromised. Thephosphor 14 is set into and supported by an opening formed in thehousing 18, for example.

FIG. 2 is a diagram showing the spectrum of output light 24 from thelight source 10. The output light 24 of the light source 10 includesblue excitation light 20 a having passed through the phosphor 14, andgreen to red fluorescent light 22 that the phosphor 14 emits, whereinthe output light 24 has a white light spectral distribution.

That is, whereas with the light source disclosed in Patent Document 1,the excitation light that is ultraviolet light is not used as a part ofthe output light for illumination frontward of a vehicle, with the lightsource 10 shown in FIG. 1, the blue excitation light is used as a partof the output light from the headlight.

As a result of investigations into the light source 10 of FIG. 1, thepresent inventors came to recognize the following problem. With thelight source 10 shown in FIG. 1, if an abnormality has occurred, e.g.,if there is a crack in the phosphor 14 or if the phosphor 14 has fallenaway from the housing 18, the excitation light 20 generated by the laserdiode 12 is directly output with strong coherence without beingscattered by the phosphor 14. That is to say, such excitation light 20having strong coherence is directly emitted forward of the vehicle,which is dangerous.

The present invention has been made in view of such a situation.Accordingly, it is an exemplary purpose of an embodiment of the presentinvention to provide a technique for detecting the occurrence of anabnormality in a sure manner in a light source configured as acombination of a blue laser diode and a phosphor.

(2) FIG. 4 is a cross-sectional diagram showing a schematicconfiguration of a vehicle lighting device 100 r. The output light of asemiconductor light source 102 is reflected by a reflector 104, andemitted forward of the vehicle via a lens 106. A heat sink 108 ismounted on the light source 102. A cooling fan 110 air-cools the heatsink 108. A lighting circuit 120 supplies a driving current thatcorresponds to the target light amount to the light source 102 so as toturn on the light source 102.

In some cases, such a vehicle lighting device 100 r is provided with aphotosensor 122 such as a photodiode or the like in order to detect anabnormality that can occur in the light source 102 or otherwise in orderto provide a feedback control operation for controlling the lightamount. With such an arrangement, the lighting circuit 120 is preferablyarranged in the vicinity of the semiconductor light source 102. On theother hand, such a photosensor 122 is required to be arranged at aposition that allows it to receive direct light, reflected light, orscattered light from the light source 102. Accordingly, in many cases,such an arrangement involves a large distance between the photosensor122 and the lighting circuit 120. Thus, such an arrangement requires thephotosensor 122 and the lighting circuit 120 to be coupled via a longwire 124.

With such an arrangement, the photosensor 122 configured as a photodiodeor the like outputs a small output current on the order of μA.Accordingly, in a case in which such a small output current istransmitted via the wire 124, such an arrangement leads to a problem ofdegraded detection precision due to the effects of noise.

SUMMARY OF THE INVENTION

The present invention has been made in order to solve such a problem.Accordingly, it is an exemplary purpose of an embodiment of the presentinvention to provide a vehicle lighting device employing a photosensorwith improved noise resistance in a signal processing operation.

(1) An embodiment of the present invention relates to an abnormalitydetector for a light source. The light source comprises: a laser diodestructured to emit an excitation light; and a phosphor structured to beexcited by the excitation light, and to emit a fluorescent light. Thelight source is structured to generate a while output light having aspectrum including the excitation light and the fluorescent light. Theabnormality detector comprises: a first photosensor structured to besensitive to a first wavelength and to be substantially insensitive to asecond wavelength, and to receive a part of the output light so as togenerate a first current that corresponds to an amount of receivedlight; a second photosensor structured to be sensitive to the secondwavelength, to be substantially insensitive to the first wavelength, andto receive a part of the output light so as to generate a second currentthat corresponds to an amount of received light; a first current/voltageconversion circuit comprising a first resistor arranged on a path of thefirst current, and structured to output a first detection voltage thatcorresponds to a voltage drop across the first resistor; and a secondcurrent/voltage conversion circuit comprising a second resistor arrangedon a path of the second current, and structured to output a seconddetection voltage that corresponds to a voltage drop across the secondresistor; and a judgment unit structured to assert an abnormalitydetection signal (i) when a magnitude relation has reversed between thefirst detection voltage and the second detection voltage, or otherwise(ii) when the first detection voltage deviates from a voltage range inwhich the first detection voltage is to be detected in a normal state.

The first detection voltage changes linearly according to the amount ofexcitation light with a slope that corresponds to the resistance valueof the first resistor. Similarly, the second detection voltage changeslinearly according to the amount of fluorescent light with a slope thatcorresponds to the resistance value of the second resistor. When thephosphor operates normally, there is a proportional relation between theintensity of the excitation light, the intensity of the fluorescentlight, and the intensity of the white light which is the output of thelight source. Accordingly, when the phosphor operates normally, theratio between the first detection voltage and the second detectionvoltage is maintained at a substantially constant level. In contrast,when the excitation light is directly emitted due to an abnormality thathas occurred in the phosphor, deviation occurs in the relation betweenthe excitation light and the fluorescent light included in the outputlight. This leads to a change in the ratio between the first detectionvoltage and the second detection voltage. With such an embodiment, byappropriately designing the resistance values of the first resistor andthe second resistor, and by monitoring the first detection voltage andthe second detection voltage, such an arrangement is capable ofdetecting an abnormality in the phosphor in a sure manner and in asimple manner regardless of the intensity of the white light, i.e.,regardless of the output of the light source.

Furthermore, if an abnormality such as an open-circuit fault, ashort-circuit fault, or the like, has occurred in the components of thefirst photosensor or the first current/voltage conversion circuit, orotherwise in a line that couples such components, the output of theamplifier that forms the first current/voltage conversion circuit isfixedly set to the power supply voltage or otherwise the ground voltage(output saturation). In this case, the first detection voltage deviatesfrom a voltage range in which the first detection voltage is to bedetected in the normal state. Thus, such an embodiment is capable ofdetecting an abnormality and a malfunction in the abnormality detectoritself.

Also, (iii) when the second detection voltage deviates from a voltagerange in which the second detection voltage is to be detected in thenormal state, the judgment unit may assert the abnormality detectionsignal.

If an abnormality such as an open-circuit fault, a short-circuit fault,or the like, has occurred in the components of the second photosensor orthe second current/voltage conversion circuit, or otherwise in a linethat couples such components, the output of the amplifier that forms thesecond current/voltage conversion circuit is fixedly set to the powersupply voltage or otherwise the ground voltage (output saturation). Inthis case, the second detection voltage deviates from a voltage range inwhich the second detection voltage is to be detected in the normalstate. Thus, such an embodiment is capable of detecting an abnormalityand a malfunction in the abnormality detector itself.

In a case in which the first current has a current value I1 and thesecond current has a current value I2 when the phosphor operatesnormally, and in a case in which the first current has a current valueI1′ and the second current has a current value I2′ when there is anabnormality in the phosphor, the resistance value R1 of the firstresistor and the resistance value R2 of the second resistor may bedesigned so as to satisfy the following Expressions.

R1×I1<R2×I2  (1)

R1×I1′>R2×I2′  (2)

In this case, such an arrangement is capable of detecting an abnormalitybased on the result of the comparison of the magnitude relation betweenthe first detection voltage and the second detection voltage.

Also, a boundary of the voltage range may be generated by dividing apower supply voltage supplied to the abnormality detector.

In a case in which deviation occurs in the power supply voltage V_(CC),this leads to a change in the saturation level of the output of theamplifier. In order to solve such a problem, the boundaries of thevoltage range (i.e., the threshold values) are generated based on avoltage obtained by dividing the power supply voltage V_(CC). Such anarrangement allows the threshold values to be adjusted according to achange in the power supply voltage V_(CC).

Also, the judgment unit may be structured to offset at least one fromamong the first detection voltage and the second detection voltage so asto increase a difference between them, and to monitor a magnituderelation between the first and second detection voltages thus offset.

When the output of the light source is small, there is a smalldifference between the first detection voltage and the second detectionvoltage. In some cases, this leads to false detection of an abnormalitydue to noise effects. By providing the offset, such an arrangementsuppresses the false detection of an abnormality when the light amountis small.

Also, the first current/voltage conversion circuit may comprise: a firstoperational amplifier arranged such that its inverting input terminal iscoupled to the first photosensor, and a fixed voltage is applied to itsnon-inverting input terminal; and a first resistor arranged between theinverting input terminal and the output terminal of the firstoperational amplifier. Also, the second current/voltage conversioncircuit may comprise: a second operational amplifier arranged such thatits inverting input terminal is coupled to the second photosensor, and afixed voltage is applied to its non-inverting input terminal; and asecond resistor arranged between the inverting input terminal and theoutput terminal of the second operational amplifier.

With such an arrangement, the gain (current/voltage conversion gain) ofthe first current/voltage conversion circuit is determined by only theresistance value of the first resistor. Furthermore, the gain of thesecond current/voltage conversion circuit is determined by only theresistance value of the second resistor. Such an arrangement allows theerror factors to be reduced, thereby providing high-precisionabnormality detection.

The first photosensor and the second photosensor may comprise a firstphotodiode and a second photodiode, respectively. The first photodiodemay be arranged such that its cathode is coupled to the inverting inputterminal of the first operational amplifier, and such that a fixedvoltage is applied to its anode. The second photodiode may be arrangedsuch that its cathode is coupled to the inverting input terminal of thesecond operational amplifier, and such that a fixed voltage is appliedto its anode.

With such an arrangement, no voltage is applied across the anode and thecathode of each photodiode. Thus, such an arrangement is capable ofdetecting light over a wide light amount range without the adverseeffects of dark current.

The first photosensor and the second photosensor may comprise a firstphotodiode and a second photodiode, respectively. The first operationalamplifier may be arranged such that its inverting input terminal iscoupled to the anode of the anode of the first photodiode, such that itsnon-inverting input terminal is coupled to the cathode of the firstphotodiode, and such that a predetermined fixed voltage is applied toits non-inverting input terminal. The second operational amplifier maybe arranged such that its inverting input terminal is coupled to theanode of the second photodiode, such that its non-inverting inputterminal is coupled to the cathode of the second photodiode, and suchthat a fixed voltage is applied to its non-inverting input terminal.

The judgment unit may comprise a voltage dividing circuit structured todivide the second detection voltage. Such an arrangement requires only asimple configuration including only a pair of resistors to provide theoffset. It should be noted that, when the output of the light source islarger than a predetermined value, the effect of such a voltage dividingcircuit thus provided, i.e., the effect of the offset thus provided, issmall. Thus, even in such a situation, such an arrangement allows theprecision of the abnormality detection to be maintained.

Also, the first current/voltage conversion circuit and the secondcurrent/voltage conversion circuit may each be configured as aninverting converter.

Also, the first photosensor may comprise first photodiode. Also, thesecond photosensor may comprise a second photodiode. Also, the firstphotodiode and the second photodiode may be configured in the form of asingle photodiode module. Also, the photodiode module may comprise: thefirst photodiode and the second photodiode arranged such that cathodesthereof are coupled so as to form a common cathode; a first anodeterminal coupled to an anode of the first photodiode; a second anodeterminal coupled to an anode of the second photodiode; a cathodeterminal coupled to the common cathode; and a metal casing structured tobe electrically insulated from the cathode terminal shared by thecathodes, the first anode terminal, and the second anode terminal. Also,the photodiode module may be housed in a CAN package.

In this case, even if the metal casing of the CAN package isshort-circuited to the ground line or otherwise to the power supplyline, such an arrangement has no effect on the operation of thephotodiodes configured as internal components of the package. Thus, suchan arrangement provides improved reliability. Furthermore, the metalcasing functions as a shield, thereby providing further improved noiseresistance.

The abnormality detection signal may be switched between a negated levelconfigured as an intermediate level between the power supply voltage andthe ground voltage and an asserted level configured as either the powersupply voltage or otherwise the ground voltage.

In the signal design for the abnormality detection signal, the assertedlevel that indicates an abnormality is assigned to a voltage level thatcannot occur when an abnormality such as an open-circuit fault, ashort-circuit fault, or the like has occurred in the signal line.Furthermore, the negated level that indicates the normal state isassigned to a voltage level that can occur when such an abnormality hasoccurred. Such an arrangement is capable of executing a suitableprotection operation even when a short-circuit fault or an open-circuitfault has occurred in the line via which the abnormality detectionsignal is to be transmitted, in addition to when the abnormalitydetection signal indicates an abnormality.

Another embodiment of the present invention relates to a vehicularlighting device. The vehicular lighting device comprises: a lightsource; and any one of the aforementioned abnormality detectors,structured to detect an abnormality in the light source.

Yet another embodiment of the present invention relates to a photodiodemodule. The photodiode module comprises: a first photodiode and a secondphotodiode arranged such that cathodes thereof are coupled so as to forma common cathode; a first anode terminal coupled to an anode of thefirst photodiode; a second anode terminal coupled to an anode of thesecond photodiode; a cathode terminal coupled to the common cathode; anda metal casing structured to be electrically insulated from the firstanode terminal, the second anode terminal, and the cathode terminal. Thephotodiode module is housed in a CAN package.

With such an embodiment, in a case in which the cathode of thephotodiode module is coupled to the power supply, such an arrangement iscapable of protecting the circuit from becoming inoperative even if themetal casing is short-circuited to the ground line. In addition, themetal casing functions as a shield, thereby providing improved noiseresistance.

Also, the photodiode module may further comprise a casing terminalcoupled to the metal casing.

With such an arrangement, by grounding the casing terminal, the electricpotential of the metal casing can be set to a fixed value, therebyproviding the metal casing with further improved performance as ashield.

(3) Yet another embodiment of the present invention relates to avehicular lighting device. The vehicular lighting device comprises: alight source; a photosensor structured to receive light from the lightsource; a preamplifier structured to amplify an output of thephotosensor, so as to generate a detection signal that indicates anamount of received light; and a lighting circuit structured to drive thelight source based on at least the output of the preamplifier. Thephotosensor and the preamplifier are mounted on a single sub-base memberthat is separate from a base member on which the lighting circuit ismounted. The sub-base member and the lighting circuit are coupled via asignal line via which a signal that corresponds to the output of thepreamplifier is transmitted, and via a power supply line via which apower supply voltage is supplied from the lighting circuit to thesub-base member.

With such an arrangement, the photosensor and the preamplifier arearranged on the same base member such that they are in the vicinity ofeach other. Accordingly, the amplified detection signal or otherwise asignal that corresponds to the detection signal can be transmitted tothe lighting circuit via wiring. That is to say, the signal to betransmitted via the line has a large amplitude. Such an arrangementprovides improved noise resistance, thereby providing improved precisionof the abnormality detection.

Also, the photosensor may be used to detect an abnormality in the lightsource. Also, the vehicular lighting device may further comprise ajudgment unit mounted on the sub-base member, and structured to generatean abnormality detection signal that indicates the presence or absenceof an abnormality in the light source based on the detection signal.

In this case, the digital signal that can switch between two states soas to indicate the presence or absence of an abnormality is transmittedto the lighting circuit via wiring. Thus, such an arrangement providesfurther improved noise resistance as compared with an arrangement inwhich the abnormality detection signal is transmitted in the form of ananalog signal.

When the abnormality detection signal indicates a normal state, theabnormality detection signal may be set to an electric potential leveldetermined between a power supply voltage and a ground voltage. When theabnormality detection signal indicates an abnormal normal state, theabnormality detection signal may be set to the power supply voltage orotherwise the ground voltage.

With such an arrangement, even if the line via which the abnormalitydetection signal is to be transmitted is short-circuited to the groundline or the power supply line, the lighting circuit is capable ofrecognizing such a situation as an abnormality. Thus, such anarrangement provides improved reliability.

Also, the vehicular lighting device according to an embodiment mayfurther comprise a reflector structured to reflect light emitted fromthe light source. Also, the photosensor may be arranged to receive lightafter it passes through a slit or otherwise a pinhole formed in thereflector.

Yet another embodiment of the present invention also relates to avehicular lighting device. The vehicular lighting device comprises: alight source that comprises a laser diode structured to emit anexcitation light and a phosphor structured to be excited by theexcitation light and to emit a fluorescent light, and that is structuredto generate a while output light having a spectrum including theexcitation light and the fluorescent light; a lighting circuitstructured to drive the light source; a first photosensor structured tobe sensitive to a wavelength of the excitation light and to besubstantially insensitive to a wavelength of the fluorescent light, andto receive a part of the output light so as to generate a first currentthat corresponds to an amount of received light; a second photosensorstructured to be sensitive to the wavelength of the fluorescent light,to be substantially insensitive to the wavelength of the excitationlight, and to receive a part of the output light so as to generate asecond current that corresponds to an amount of received light; a firstpreamplifier comprising a first operational amplifier and a firstresistor arranged on a path of the first current, and structured tooutput a first detection signal that corresponds to a voltage dropacross the first resistor; a second preamplifier comprising a secondoperational amplifier and a second resistor arranged on a path of thesecond current, and structured to output a second detection signal thatcorresponds to a voltage drop across the second resistor; and ajudgement unit structured to judge the presence or absence of anabnormality in the light source based on the first detection signal andthe second detection signal. The first photosensor, the secondphotosensor, the first preamplifier, and the second preamplifier aremounted on a single sub-base member that is separate from a base memberon which the lighting circuit is mounted.

Also, the judgment unit may be mounted on the sub-base member.

In this case, the digital signal configured as a binary signal thatindicates the presence or absence of an abnormality is transmitted tothe lighting circuit via wiring. Thus, such an arrangement providesfurther improved noise resistance as compared with an arrangement inwhich the abnormality detection signal is transmitted in the form of ananalog signal.

BRIEF DESCRIPTION OF THE DRAWINGS

Embodiments will now be described, by way of example only, withreference to the accompanying drawings which are meant to be exemplary,not limiting, and wherein like elements are numbered alike in severalFigures, in which:

FIG. 1 is a cross-sectional view of a light source of a vehicularlighting device investigated by the present inventor;

FIG. 2 is a diagram showing a spectrum of the output light of the lightsource;

FIG. 3 is a cross-sectional view of a light source of a vehicularlighting device;

FIG. 4 is a block diagram showing a vehicular lighting device includingan abnormality detector according to a first embodiment;

FIG. 5A is a diagram showing the relation between the intensity of theoutput light, the first detection voltage, and the second detectionvoltage when a phosphor operates normally, and FIG. 5B is a diagramshowing the relation between the intensity of the output light, thefirst detection voltage, and the second detection voltage when there isan abnormality in the phosphor;

FIG. 6 is a circuit diagram showing an abnormality detector according toa first example configuration;

FIG. 7A is a diagram showing the relation between the intensity of theoutput light, the first detection voltage, and the second detectionvoltage when a phosphor operates normally, and FIG. 7B is a diagramshowing the relation between the intensity of the output light, thefirst detection voltage, and the second detection voltage when there isan abnormality in the phosphor;

FIG. 8 is a diagram for explaining abnormality judgment based ondetection voltage;

FIG. 9 is a circuit diagram showing an abnormality detector according toa second example configuration;

FIG. 10 is a diagram showing the relation between the intensity of theoutput light, the first detection voltage, and the second detectionvoltage, obtained by the abnormality detector shown in FIG. 9 when thephosphor operates normally;

FIG. 11 is a circuit diagram showing an abnormality detector accordingto a first modification;

FIG. 12A is an equivalent circuit diagram showing a package including aphotodiode pair, and FIG. 12B is a cross-sectional view of a schematicconfiguration thereof;

FIG. 13 is a cross-sectional view of a vehicular lighting deviceaccording to a third embodiment;

FIG. 14 is a circuit diagram showing an abnormality detector accordingto an example 1;

FIG. 15 is a perspective view showing the abnormality detector shown inFIG. 14;

FIG. 16 is a circuit diagram showing an abnormality detector accordingto an example 2;

FIG. 17 is a circuit diagram showing a reception circuit;

FIG. 18 is a circuit diagram showing an abnormality detector accordingto a modification; and

FIG. 19 is a perspective view showing a lamp unit including thevehicular lighting device according to the embodiment.

DETAILED DESCRIPTION OF THE INVENTION

Description will be made below regarding preferred embodiments accordingto the present invention with reference to the drawings. The same orsimilar components, members, and processes are denoted by the samereference numerals, and redundant description thereof will be omitted asappropriate. The embodiments have been described for exemplary purposesonly, and are by no means intended to restrict the present invention.Also, it is not necessarily essential for the present invention that allthe features or a combination thereof be provided as described in theembodiments.

In the present specification, the state represented by the phrase “themember A is coupled to the member B” includes a state in which themember A is indirectly coupled to the member B via another member thatdoes not substantially affect the electric connection therebetween, orthat does not damage the functions or effects of the connectiontherebetween, in addition to a state in which the member A is physicallyand directly coupled to the member B.

Similarly, the state represented by the phrase “the member C is providedbetween the member A and the member B” includes a state in which themember A is indirectly coupled to the member C, or the member B isindirectly coupled to the member C via another member that does notsubstantially affect the electric connection therebetween, or that doesnot damage the functions or effects of the connection therebetween, inaddition to a state in which the member A is directly coupled to themember C, or the member B is directly coupled to the member C.

In the present specification, the reference symbols denoting electricsignals such as a voltage signal, current signal, or the like, and thereference symbols denoting circuit elements such as a resistor,capacitor, or the like, also represent the corresponding voltage value,current value, resistance value, or capacitance value as necessary.

First Embodiment

FIG. 4 is a block diagram showing a vehicle lighting device 1 includingan abnormality detector 30 according to a first embodiment. The vehiclelighting device 1 includes a light source 10 and the abnormalitydetector 30 configured to detect an abnormality that can occur in thelight source 10.

As described above with reference to FIG. 1, the light source 10includes a laser diode 12, a phosphor 14, and an optical system 16. Thelaser diode 12 emits excitation light 20. The laser diode 12 emits lightwith an intensity that corresponds to a driving current received from anunshown driving circuit. The phosphor 14 is arranged on an optical pathfor the excitation light 20. The phosphor 14 is excited by theexcitation light 20, and emits fluorescent light 22. The light source 10is configured to generate white output light 24 having a spectrumincluding the excitation light 20 and the fluorescent light 22.

The abnormality detector 30 receives a part of the output light 24, soas to judge the presence or absence of an abnormality that can occur inthe light source 10, and more specifically, to judge the presence orabsence of an abnormality that can occur in the phosphor 14. Examples ofsuch an abnormality that can occur in the phosphor 14 include cracking,dislocation, aging degradation, and the like. However, the abnormalityis not particularly restricted in kind.

The abnormality detector 30 includes a first photosensor 32, a secondphotosensor 34, a first preamplifier (which will also be referred to asa “first current/voltage conversion circuit”) 36, a second preamplifier(which will also be referred to as a “second current/voltage conversioncircuit”) 38, and a judgment unit 40. The first photosensor 32 isconfigured to be sensitive to the wavelength of the excitation light 20,and to be substantially insensitive to the wavelength of the fluorescentlight 22. The first photosensor 32 receives a part of the output light24, and generates a first current I_(SC1) that corresponds to theintensity of the excitation light 20 after it passes through thephosphor 14. In contrast, the second photosensor 34 is configured to besensitive to the wavelength of the fluorescent light 22, and to beinsensitive to the wavelength of the excitation light 20. The secondphotosensor 34 receives a part of the output light 24, and generates asecond current I_(SC2) that corresponds to the intensity of thefluorescent light 22 emitted from the phosphor 14.

In order to provide a suitable wavelength-dependent sensitivity, i.e., asuitable wavelength selectivity, the first photosensor 32 and the secondphotosensor 34 may each be configured employing a color filter. Also, inorder to provide such a function, the semiconductor material or thedevice structure may be designed for each sensor. Also, the firstphotosensor 32 and the second photosensor 34 are not particularlyrestricted in kind. Specifically, the first photosensor 32 and thesecond photosensor 34 may each be configured as a semiconductorphotosensor such as a photodiode, a phototransistor, or the like.Description will be made in the present embodiment assuming that thefirst photosensor 32 and the second photosensor 34 each include aphotodiode.

The first current/voltage conversion circuit 36 includes a firstresistor R1 arranged on a path of the first current I_(SC1), and outputsa first detection voltage V1 that corresponds to a voltage drop V_(SC1)across the first resistor R1. The first detection voltage V1 changeslinearly according to the first current I_(SC1) with a slope thatcorresponds to the resistance value of the first resistor R1.

The second current/voltage conversion circuit 38 includes a secondresistor R2 arranged on a path of the second current I_(SC2), andoutputs a second detection voltage V2 that corresponds to a voltage dropV_(SC2) across the second resistor R2. The second detection voltage V2changes linearly according to the second current I_(SC2) with a slopethat corresponds to the resistance value of the second resistor R2.

The judgement unit 40 judges the presence or absence of an abnormalitybased on the first detection voltage V1 and the second detection voltageV2. Upon detection of an abnormality, the judgment unit 40 asserts (setsto the high level, for example) an abnormality detection signal S1.

Specifically, (i) when the magnitude relation between the firstdetection voltage V1 and the second detection voltage V2 has reversedfrom that in the normal state, (ii) when the first detection voltage V1deviates from a voltage range in which the first detection voltage V1 isto be detected in a normal state, or (iii) when the second detectionvoltage V2 deviates from a voltage range in which the second detectionvoltage V2 is to be detected in the normal state, the judgment unit 40asserts the abnormality detection signal S1.

The above is the basic configuration of the abnormality detector 30.Next, description will be made regarding the operation mechanismthereof.

The first detection voltage V1 changes linearly according to the lightamount of the excitation light 20 with a slope determined according tothe resistance value of the first resistor R1. Similarly, the seconddetection voltage V2 changes linearly according to the light amount ofthe fluorescent light 22 with a slope determined according to theresistance value of the second resistor R2. With such an arrangement,when the phosphor 14 operates normally, there is a proportional relationbetween the intensity of the excitation light 20, the intensity of thefluorescent light 22, and the intensity of the output light 24 emittedfrom the light source 10. Accordingly, when the phosphor 14 operatesnormally, the ratio between the first detection voltage V1 and thesecond detection voltage V2 exhibits a substantially constant value. Incontrast, when the excitation light 20 is directly emitted due to theoccurrence of an abnormality in the phosphor 14, the intensity ratiobetween the excitation light 20 and the fluorescent light 22 included inthe output light 24 deviates from that in the normal state, leading to achange in the ratio between the first detection voltage V1 and thesecond detection voltage V2. With the abnormality detector 30 shown inFIG. 4, by appropriately designing the resistance values of the firstresistor R1 and the second resistor R2, and by monitoring the firstdetection voltage V1 and the second detection voltage V2, such anarrangement is capable of detecting, in a simple and sure manner, anabnormality that can occur in the phosphor 14 regardless of theintensity of the white light, i.e., regardless of the output level ofthe light source.

FIG. 5A is a diagram showing the relation between the output lightintensity, the first detection voltage V1, and the second detectionvoltage V2, when the phosphor 14 operates normally. FIG. 5B is a diagramshowing the relation between the output light intensity, the firstdetection voltage V1, and the second detection voltage V2, when there isan abnormality in the phosphor 14.

Description will be made below assuming that, when the output light hasa given intensity, and when the phosphor 14 operates normally, the firstcurrent I_(SC1) has a current value of I1, and the second currentI_(SC2) has a current value of I2, and assuming that, when there isabnormality in the phosphor 14, the first current I_(SC1) has a currentvalue of I1′, and the second current I_(SC2) has a current value of I2′.When an abnormality has occurred in the phosphor 14, the intensity ofthe fluorescent light 22 falls, and the excitation light 20 passesthrough without being converted into the fluorescent light 22. Thus, therelations I1′>I1 and I2′<I2 hold true. With such an arrangement, theresistance values of the first resistor R1 and the second resistor R2are preferably designed so as to satisfy the following relationexpressions.

R1×I1<R2×I2  (1)

R1×I1′>R2×I2′  (2)

The abnormality detector 30 monitors the magnitude relation between thefirst detection voltage V1 and the second detection voltage V2. When themagnitude relation thus monitored has reversed from the relation in anormal state, the abnormality detector 30 judges that there is anabnormality. The operation of the abnormality detector 30 is equivalentto comparison between: the ratio between the detection current I_(SC1)generated by the first photosensor 32 and the detection current I_(SC2)generated by the second photosensor 34, which is represented byI_(SC1)/I_(SC2); and the resistance ratio between the first resistor R1and the second resistor R2, i.e., R2/R1. When the ratio between theintensity of the blue excitation light 20 and the intensity of theyellow fluorescent light, which is represented by I_(SC1)/I_(SC2),exceeds a predetermined threshold value (R2/R1), the abnormalitydetector 30 is capable of judging that there is an abnormality.

When an abnormality such as an open-circuit fault or a short-circuitfault has occurred in a component such as the first photosensor 32 orthe first current/voltage conversion circuit 36 or in a line thatcouples such components, the output of an amplifier (not shown), whichis a component of the first current/voltage conversion circuit 36, isfixedly set to the power supply voltage V_(CC) or otherwise to theground voltage V_(GND) (output saturation). In this state, the firstdetection voltage V1 is fixedly set to the power supply voltage V_(CC)or otherwise to the ground voltage V_(GND). That is to say, the firstdetection voltage V1 deviates from the voltage range in which it is tobe detected in a normal state. Thus, with the abnormality detector 30shown in FIG. 4, such an arrangement is capable of detecting anabnormality and a malfunction that can occur in the abnormality detector30 itself.

Similarly, when an abnormality such as an open-circuit fault or ashort-circuit fault has occurred in a component such as the secondphotosensor 34 or the second current/voltage conversion circuit 38 or ina line that couples such components, the output of an amplifier (notshown), which is a component of the second current/voltage conversioncircuit 38, is fixedly set to the power supply voltage V_(CC) orotherwise to the ground voltage V_(GND). In this state, the seconddetection voltage V2 deviates from the voltage range in which it is tobe detected in a normal state. Thus, with the abnormality detector 30shown in FIG. 4, such an arrangement is capable of detecting anabnormality and a malfunction that can occur in the abnormality detector30 itself.

The present invention encompasses various kinds of circuits that can beregarded as a block configuration shown in FIG. 4. Description will bemade below regarding specific examples thereof.

FIG. 6 is a circuit diagram showing an abnormality detector 30 accordingto a first example configuration.

With such an example configuration, the first photosensor 32 includes afirst photodiode PD1 and a first color filter CF1. The first colorfilter CF1 is configured to have a high transmittance for blue lightthat corresponds to the wavelength of the excitation light 20, and tohave a low transmittance for the wavelength of the fluorescent light 22.The second photosensor 34 includes a second photodiode PD2 and a secondcolor filter CF2. The second color filter CF2 is configured to have ahigh transmittance for a wavelength range from green to red thatcorresponds to the wavelength range of the fluorescent light 22, and tohave a low transmittance for blue light. As the first color filter CF1,a blue filter may be employed. As the second color filter CF2, a yellowfilter, a green filter, or otherwise a red filter may be employed.

The first current/voltage conversion circuit 36 includes a firstoperational amplifier OA21 arranged such that its inverting inputterminal (−) is coupled to an anode of the first photodiode PD1, itsnon-inverting input terminal (+) is coupled to a cathode of the firstphotodiode PD1, and a predetermined fixed voltage is applied to itsnon-inverting input terminal (+). For example, the fixed voltage may beconfigured as the power supply voltage V_(CC). Also, the fixed voltagemay be set to other voltage levels. Resistors R21 and R22 correspond tothe resistors R1 and R2 shown in FIG. 4, respectively.

The voltage level of the first detection voltage V21 generated by thefirst current/voltage conversion circuit 36 shown in FIG. 6 isrepresented by the following Expression (3).

V21=V _(CC) −R21×I _(SC1)  (3)

The second current/voltage conversion circuit 38 is configured in thesame manner as the first current/voltage conversion circuit 36. Thevoltage level of the output V22 is represented by the followingExpression (4).

V22=V _(CC) −R22×I _(SC2)  (4)

The judgment unit 40 includes voltage comparators CMP21, CMP31, CMP32,CMP41, and CMP42. When V21>V22, i.e., when the phosphor operatesnormally, the voltage comparator CMP21 sets an abnormality detectionsignal S1 a to the low level (negated). Conversely, when V21<V22, i.e.,when there is an abnormality in the phosphor, the voltage comparatorCMP21 sets the abnormal detection signal S1 a to the high level(asserted).

The current/voltage conversion gain (transimpedance) of the firstcurrent/voltage conversion circuit 36 depends on only the first resistorR1, and that of the second current/voltage conversion circuit 38 dependson only the second resistor R2. Such an arrangement allows the effectsdue to variation in the circuit elements to be reduced, therebyproviding high-precision abnormality detection.

A pair of voltage comparators CMP31 and CMP32 judge whether or not thefirst detection voltage V21 is within a normal voltage range. Thevoltage comparator CMP31 compares the first detection voltage V21 withan upper-side threshold voltage V_(THH). When V21>V_(THH), the voltagecomparator CMP31 asserts (sets to the high level) an abnormalitydetection signal S1H. Conversely, when V21<V_(THH), the voltagecomparator CMP31 negates (sets to the low level) the abnormalitydetection signal S1H. The voltage comparator CMP32 compares the firstdetection voltage V21 with a lower-side threshold voltage V_(THL). WhenV21<V_(THL), the voltage comparator CMP32 asserts (sets to the highlevel) an abnormality detection signal S1L. Conversely, whenV21>V_(THL), the voltage comparator CMP32 negates (sets to the lowlevel) the abnormality detection signal S1L. The threshold voltageV_(THL) may be determined based on the lower limit of the normal voltagerange. The threshold voltage V_(THH) may be determined based on theupper limit of the normal voltage range. For example, in a case in whichV_(CC)=5V, the threshold voltage V_(THH) may be set to a value in thevicinity of 4.4 V, and the threshold voltage V_(THL) may be set to avalue in the vicinity of 0.1 V.

In the same way, a pair of voltage comparators CMP41 and CMP42 judgewhether or not the second detection voltage V22 is within the normalvoltage range. When V22>V_(THH), an abnormality detection signal S2H isasserted. Conversely, when V22<V_(THL), an abnormality detection signalS2L is asserted.

A logic gate 48 performs a logical operation on the outputs of therespective comparators. When at least one of the outputs of thecomparators is asserted, the logic gate 48 asserts (sets to the highlevel, for example) the abnormality detection signal S1 configured as afinal output. In the logic system shown in FIG. 6, the logic gate isconfigured as an OR gate.

The above is the configuration of the abnormality detector 30 accordingto the first example configuration. Next, description will be maderegarding the operation thereof.

FIG. 7A is a diagram showing the relation between the output lightintensity, the first detection voltage V21, and the second detectionvoltage V22, when the phosphor 14 operates normally. FIG. 7B is adiagram showing the relation between the output light intensity, thefirst detection voltage V21, and the second detection voltage V22, whenthere is an abnormality in the phosphor 14. As described above, theresistance values of the resistors R21 and R22 are designed such thatthe relation expressions (1) and (2) hold true. Accordingly, when thephosphor 14 operates normally, the relation V21>V22 holds true.Conversely, when there is an abnormality, the relation V22<V21 holdstrue. When V21>V22, i.e., when the phosphor 14 operates normally, thevoltage comparator CMP21 shown in FIG. 6 sets the abnormality detectionsignal S1 a to the low level (signal negation). Conversely, whenV21<V22, i.e., when there is an abnormality, the voltage comparatorCMP21 sets the abnormality detection signal S1 a to the high level(signal assertion).

FIG. 8 is a diagram for explaining abnormality judgement based on thedetection voltage V21 (V22). Description will be made regarding a casein which such abnormality judgment is made based on the detectionvoltage V21. As shown in FIG. 7A, as the light amount becomes larger,the detection voltage V21 becomes lower.

When a circuit abnormality such as an open-circuit fault, short-circuitfault, or the like has occurred in the first photodiode PD1, the firstresistor R21, or the output of the first operational amplifier OA21, theoutput V21 of the first operational amplifier OA21 is fixedly set to theupper limit or otherwise the lower limit of its output range, i.e.,output saturation occurs in the output V21. For example, in a case inwhich the first operational amplifier OA21 is configured as aRail-To-Rail operational amplifier that is capable of providing outputthat is swingable over a full range between the power supply voltageV_(CC) and the ground voltage V_(GND), when output saturation hasoccurred, the output V21 is fixedly set to a value in the vicinity ofV_(CC) or otherwise in the vicinity of V_(GND).

With such an arrangement, the upper-side threshold voltage V_(THH) isset to a value in the vicinity of the power supply voltage V_(CC), andthe lower-side threshold voltage V_(THL) is set to a value in thevicinity of the ground voltage V_(CC). By comparing the detectionvoltage V21 with the threshold voltages V_(THH) and V_(THL) thus set,such an arrangement is capable of detecting an abnormality such as anopen-circuit fault, short-circuit fault, and the like.

With the circuit shown in FIG. 6, when V21>V_(THH), it can be assumedthat an abnormality such as an open-circuit fault, short-circuit fault,or the like has occurred in a component, or that COD (CatastrophicOptical Damage) has occurred in the laser diode 12. COD represents amalfunction of the laser diode 12 involving drastic degradation of theoutput light amount without change in the electrical characteristics.Similarly, when V21<V_(THL), it can be assumed that an abnormality suchas an open-circuit fault, short-circuit fault, or the like has occurredin a component.

In the same mechanism, by monitoring the second detection voltage V22,such an arrangement is capable of detecting a malfunction such as anopen-circuit fault, short-circuit fault, or the like that can occur inthe second photodiode PD2, the second operational amplifier OA22, theresistor R21, and the like. Conversely, when V22<V_(THH), it can also beassumed that the light amount of the fluorescent light 22 drasticallyfalls. In this case, examples of suspected causes include the phosphor14 falling away from the housing, and the like.

As described above, with the abnormality detector 30 according to theembodiment, such an arrangement is capable of detecting an open-circuitfault, a short-circuit fault, COD that can occur in the laser diode 12,the phosphor 14 falling away from the housing, and the like. Thus, suchan arrangement allows a suitable fail-handling operation to beperformed.

FIG. 9 is a circuit diagram showing an abnormality detector 30 aaccording to a second example configuration. In connection with thefirst current/voltage conversion circuit 36 and the secondcurrent/voltage conversion circuit 38, capacitors C21 and C22 areprovided in order to provide noise removal. A voltage dividing circuitincluding resistors R8 through R10 divides the power supply voltageV_(CC) so as to generate the threshold voltages V_(THH) and V_(THL). Avoltage dividing circuit including resistors R11 through R13 operates inthe same manner.

When deviation occurs in the power supply voltage V_(CC), this leads toa change in the saturation level of the amplifier output. In a case inwhich the threshold voltages V_(THH) and V_(THL) are each set to a fixedvalue, in some cases, such deviation of the power supply voltage V_(CC)leads to a false detection of an abnormality. In order to solve such aproblem, by generating the boundaries of the voltage range, i.e., thethreshold voltages V_(THH) and V_(THL), based on a voltage obtained bydividing the power supply voltage V_(CC), such an arrangement is capableof adjusting the threshold voltages V_(THH) and V_(THL) according to achange in the power supply voltage V_(CC). Thus, such an arrangement iscapable of preventing such false detection.

The abnormality detector 30 a further includes a voltage dividingcircuit 43 including the resistors R16 and R17, in addition to thecomponents of the abnormality detector 30 shown in FIG. 6. Descriptionwill be made regarding the reason for this.

With such an example configuration shown in FIG. 6, when the outputlight intensity is small, such an arrangement provides the detectioncurrents I_(SC1) and I_(SC2) each having a small value. In this case,there is only a small difference between the first detection voltage V21and the second detection voltage V22. Accordingly, in a case in whichthere is non-negligible noise, variation in the circuit elements, offsetvoltage of the operational amplifier or the voltage comparator, or thelike (which will be referred to as “error factors” hereafter), and whenthe output light intensity is small, in some cases, the magnituderelation between the first detection voltage V21 and the seconddetection voltage V22 is wrongly reversed, which leads to a problem offalse detection of an abnormality. Alternatively, in some cases, such anarrangement is not able to detect an abnormality even when thereactually is an abnormality, which is also a problem.

In order to solve such a problem, a judgment unit 40 a offsets at leastone of the first detection voltage V21 and the second detection voltageV22 so as to increase the difference between them. The judgement unit 40a judges the presence or absence of an abnormality based on the offsetdetection voltages V21 and V22.

In the present embodiment, the voltage dividing circuit including theresistors R16 and R17 is provided in order to offset the seconddetection voltage V22 toward the low electric potential side. Thevoltage comparator CMP21 compares the second detection voltage V32 thusoffset by the voltage dividing circuit with the first detection voltageV21.

FIG. 10 is a diagram showing the relation between the output lightintensity, the first detection voltage V21, and the second detectionvoltage V22, in a case of employing the abnormality detector 30 a shownin FIG. 9 when the phosphor 14 operates normally. With the abnormalitydetector 30 a, the second detection voltage V32 after voltage divisionis represented by the following Expression (5).

$\begin{matrix}\begin{matrix}{{V\; 32} = {R\; {17/( {{R\; 16} + {R\; 17}} )} \times V\; 22}} \\{= {{R\; {17/( {{R\; 16} + {R\; 17}} )} \times V_{CC}} -}} \\{{R\; {17/( {{R\; 16} + {R\; 17}} )} \times R\; 22 \times I_{{SC}\; 2}}}\end{matrix} & (5)\end{matrix}$

That is to say, the y-intercept of the second detection voltage V32shown in FIG. 10 is offset so as to increase the difference in they-intercept between the first detection voltage V21 and the seconddetection voltage V32. The offset width ΔV is represented byV_(CC)×R16/(R16+R17) That is to say, the offset width ΔV can be adjustedby means of the resistors R16 and R17. For example, description will bemade assuming that the offset voltage of the voltage comparator CMP21acts as a dominant error factor. In this case, the offset width ΔV ispreferably set to a value (e.g., 20 mV) that is slightly larger than theoffset voltage of the voltage comparator CMP21.

With the abnormality detector 30 a, such an arrangement providesimproved detection precision even when the output light intensity issmall. In particular, such an arrangement shown in FIG. 9 requires onlytwo resistors R16 and R17 included in the voltage dividing circuit.Thus, such an arrangement requires only a low cost and a small circuitarea to provide improved detection precision.

Furthermore, as described above, in a case of employing such a voltagedividing circuit including the resistors R16 and R17, such anarrangement provides the divided second detection voltage V32 having aslope with an absolute value that is smaller than the absolute value ina case in which such a voltage dividing circuit is not employed.Accordingly, in a range A in which the output light has a sufficientlylarge intensity, the offset width ΔV provided by the voltage dividingcircuit has a sufficiently small effect as compared with a range inwhich the output light has a small intensity. Thus, such an arrangementhas only a negligible effect on the detection value.

It can be clearly understood that, by providing such a voltage dividingcircuit comprising the resistors R16 and R17, and by optimizing theresistance value of the second resistor R22, such an arrangement allowsthe slope of the second detection voltage V32 and the offset width ΔV tobe designed independently as desired.

It should be noted that a combination of the resistors R14 and R15 andthe voltage comparator CMP22 is configured as a replica of thecombination of the resistors R16 and R17 and the voltage comparatorCMP21. That is to say, such an arrangement provides a redundantconfiguration. Accordingly, such a redundant configuration may beomitted.

Each voltage comparator CMP has a push-pull output configuration. Withsuch an arrangement, when an abnormality has been detected, the outputis set to the low level (V_(GND)). When a normal state has beendetected, the output is set to the high level. The outputs of suchmultiple voltage comparators are supplied to an OR circuit 48 aincluding diodes D1 through D6 each having an anode coupled to a commonnode. Also, such voltage compactors CMP may be each configured to havean open-collector (open-drain) configuration. With such an arrangement,the diodes D1 through D6 may be omitted.

A level shift circuit 46 shifts the level of a signal S3 that can switchbetween two states, i.e., between the high-impedance level and theV_(GND) level, so as to generate the abnormality detection signal S1that can switch between a middle level V_(MID) and the ground levelV_(GND).

When the outputs of all the voltage comparators are each set to the highlevel, the base voltage Vb1 of a transistor Tr1 is represented byVb1=V_(CC)×R19/(R18+R19) In this state, the level shift circuit 46outputs the emitter voltage (=Vb1−Vbe) of the transistor Tr1 as theabnormality detection signal S1 having the middle level V_(MID). Aresistor R20 and a capacitor C3 are provided in order to protect thecircuit from static electricity.

When at least one of the voltage comparators outputs the low-levelsignal as a result of detecting an abnormality, the electric potentialat the base of the transistor Tr1 falls, which turns off the transistorTr1. As a result, the emitter is set to the high-impedance state. Theemitter of the transistor Tr1 is pulled down by a reception circuit ofthe lighting circuit 120 side. With such an arrangement, the abnormalitydetection signal S1 is set to the low-level voltage V_(GND).

By providing the level shift circuit 46, the abnormality detectionsignal S1, which can be switched between two levels, is transmitted inthe form of either the middle level V_(MID) or otherwise one from amongthe high level or the low level (V_(GND) in this example), instead ofbeing transmitted in the form of either the high level or otherwise thelow level. When the lighting circuit 120 receives the abnormalitydetection signal S1 having the middle level V_(MID), the lightingcircuit 120 instructs the light source 10 to operate normally. When theabnormality detection signal S1 deviates from the middle level V_(MID),the lighting circuit 120 executes a suitable protection operation suchas turning off the light source 10.

That is to say, in the signal design for the abnormality detectionsignal S1, the asserted level that indicates an abnormality is assignedto the middle level V_(MID), which cannot occur when an abnormality suchas an open-circuit fault, a short-circuit fault, or the like hasoccurred. Furthermore, the negated level that indicates the normal stateis assigned to the voltage level that can occur when such an abnormalityhas occurred. Such an arrangement is capable of executing a suitableprotection operation even when a short-circuit fault or an open-circuitfault has occurred in the line via which the abnormality detectionsignal S1 is to be transmitted, in addition to when the abnormalitydetection signal S1 indicates an abnormality (when the abnormalitydetection signal S1 is asserted).

Description has been made above regarding an aspect of the presentinvention with reference to the first embodiment. The above-describedfirst embodiment has been described for exemplary purposes only, and isby no means intended to be interpreted restrictively. Rather, it can bereadily conceived by those skilled in this art that variousmodifications may be made by making various combinations of theaforementioned components or processes, which are also encompassed inthe technical scope of the present invention. Description will be madebelow regarding such modifications.

First Modification

FIG. 11 is a circuit diagram showing an abnormality detector 30 baccording to a first modification. Description has been made withreference to FIG. 6 regarding an arrangement employing thecurrent/voltage conversion circuit 36 (38) configured as an invertingconverter. Also, the current/voltage conversion circuit may beconfigured as a non-inverting converter. The first current/voltageconversion circuit 36 includes a first operational amplifier OA1 inaddition to the first resistor R1. The first operational amplifier OA1is arranged such that its inverting input terminal (−) is coupled to thefirst photosensor 32, and a fixed voltage is applied to itsnon-inverting input terminal (+). The fixed voltage is configured as theground voltage, for example. The first resistor R1 is arranged betweenthe inverting input terminal (−) and the output terminal of the firstoperational amplifier OA1.

More specifically, the inverting input terminal (−) of the firstoperational amplifier OA1 is coupled to the cathode of the firstphotodiode PD1 of the first photosensor 32. A fixed voltage (groundvoltage) is applied to the anode of the first photodiode PD1.

The voltage level of the first detection voltage V1 generated by thefirst current/voltage conversion circuit 36 is represented by thefollowing Expression (6).

V1=R1×I _(SC1)  (6)

The second current/voltage conversion circuit 38 has the sameconfiguration as that of the first current/voltage conversion circuit36, including a second operational amplifier OA2 in addition to thesecond resistor R2. The voltage level of the output V2 of the secondcurrent/voltage conversion circuit 38 is represented by the followingExpression (7).

V2=R2×I _(SC2)  (7)

With the first current/voltage conversion circuit 36 shown in FIG. 11,by virtually grounding the first operational amplifier OA1, the groundvoltage is applied to each of the anode and the cathode of the firstphotodiode PD1. That is to say, the voltage difference between the anodeand the cathode of the first photodiode PD1 is set to substantiallyzero. Such an arrangement is capable of detecting light over a widelight amount range without receiving the effects of dark current. Thesame can be said of the second current/voltage conversion circuit 38.

A judgment unit 40 b includes the voltage comparator CMP21 that makes acomparison between the first detection voltage V1 and the seconddetection voltage V2. When V1<V2, i.e., when the phosphor 14 operatesnormally, an abnormality detection signal S1 a output from the voltagecomparator CMP21 is set to the low level (negated). Conversely, whenV1>V2, i.e., when there is an abnormality in the phosphor 14, theabnormality detection signal S1 a is set to the high level (asserted).It should be noted that other comparators included in the judgment unit40 b are not shown in FIG. 1.

Second Modification

Description has been made in the embodiment regarding an arrangement inwhich the judgment unit 40 is configured including the voltagecomparator CMP21 or the like. However, the present invention is notrestricted to such an arrangement. For example, after the firstdetection voltage V1 and the second detection voltage V2 arerespectively converted into digital values D1 and D2 by means of an A/Dconverter, the judgment unit 40 may perform signal processing on thedigital values D1 and D2 thus converted, so as to perform theabnormality judgment.

Third Modification

Description has been made with reference to the example configurationshown in FIG. 9 regarding an arrangement in which the detection voltageis offset. The method for providing such an arrangement is notrestricted to such an arrangement employing such a voltage dividingcircuit comprising the resistors R16 and R17. For example, the voltagecomparator CMP21 may be configured to be capable of adjusting the inputoffset voltage. With such an arrangement, at least one of the firstdetection voltage V1 and the second detection voltage V2 may be offset.Such an arrangement is capable of preventing false detection of anabnormality due to error factors such as noise or the like.Alternatively, the first detection voltage V21 may be offset toward thehigh electric potential side. In this case, a voltage dividing circuitincluding a pair of resistors coupled in series may be arranged betweenthe output V21 of the first current/voltage conversion circuit 36 andthe power supply voltage V_(CC). The divided voltage at a connectionnode that connects the pair of resistors is set to a voltage obtained byshifting the first detection voltage V21 toward the power supply voltageside.

Fourth Modification

With the abnormality detector 30 b shown in FIG. 11, at least one fromamong the first detection voltage V1 and the second detection voltage V2may be offset, which is also effective as a modification. Specifically,the second detection voltage V2 may be offset toward the positiveelectric potential side (high electric potential side). In order toprovide such a function, a fixed voltage that corresponds to the offsetwidth ΔV may preferably be applied to the non-inverting input terminal(+) of the second operational amplifier OA2.

Alternatively, a voltage dividing circuit including a pair of resistorscoupled in series may preferably be arranged between the output V2 ofthe second current/voltage conversion circuit 38 and the power supplyvoltage V_(CC). The divided voltage thus generated at a connection nodethat couples the pair of resistors is configured as a voltage obtainedby shifting the second detection voltage V2 toward the power supplyvoltage V_(CC) side.

Second Embodiment

The second embodiment relates to a package housing the first photodiodePD1 and the second photodiode PD2 each configured as an abnormalitydetector.

In a case in which such photodiodes are employed in a vehicle, in orderto secure long-term reliability even in an inhospitable environment inwhich they are exposed to high temperature and high humidity, thermalshock, or the like, a CAN package is employed. In a case in which a pairof photodiodes are housed in a single package, the pair of photodiodesare arranged such that their cathodes are coupled so as to form a commoncathode, and their cathodes are electrically coupled to a metal casing.

In a case of employing such a pair of photodiodes configured in a commoncathode manner housed in a CAN package, the configuration shown in FIG.11 cannot be employed. Accordingly, the current/voltage conversioncircuits 36 and 38 are each required to be configured as an invertingconverter as shown in FIG. 6 or 9. However, in a case in which theabnormal detector 30 shown in FIG. 6 or 9 is configured as such aphotodiode pair housed in a CAN package, the electric potential at thecathode is set to the power supply voltage V_(CC). Accordingly, theelectric potential at the metal casing is also set to the power supplyvoltage V_(CC). In many cases, other metal structures mounted within thelighting device are grounded in order to protect the circuit fromelectromagnetic noise. Accordingly, if a contact occurs between such ametal casing and other metal structures in the vicinity of the metalcasing, this leads to a short-circuit fault between the power supply andthe ground. This leads to a problem in that the photodiodes cannotoperate normally. In addition, this leads to a problem in that othercircuit blocks that share the power supply voltage V_(CC) cannot operatenormally.

In order to solve such a problem, the abnormality detector 30 shown inFIG. 6 or 9 is housed in the form of a photodiode module 300 having thefollowing configuration. FIG. 12A is an equivalent circuit diagramshowing the photodiode module 300 including a pair of photodiodes PD1and PD2. FIG. 12B is a cross-sectional view showing a schematicconfiguration thereof. The photodiode module 300 includes anodeterminals A1 and A2, a cathode terminal K, a pair of photodiodes PD1 andPD2, and a metal casing 302. The metal casing 302 is electricallyinsulated from the cathode terminal K. An opening 304 is formed in thetop face of the metal casing, which allows the photodiodes PD1 and PD2to receive light. The photodiodes PD1 and PD2 may each be configured tohave a light-receiving portion covered by a color filter.

With such an arrangement employing such an abnormality detector 30, aweak current on the order of jiA flows through each of the photodiodesPD1 and PD2. Furthermore, each current/voltage conversion circuit has avery high input impedance. Accordingly, it can be said that such anarrangement provides the abnormality detector 30 with poor noiseresistance. In order to solve such a problem, the photodiode module 300is preferably provided with a casing terminal C electrically coupled tothe metal casing 302. In this case, by grounding the casing terminal C,the metal casing 302 functions as a shield, thereby providing improvedelectromagnetic noise resistance.

Third Embodiment

FIG. 13 is a cross-sectional diagram showing a vehicular lighting device100 according to a third embodiment. Description of the sameconfiguration as that shown in FIG. 3 will be omitted.

The photosensor 122 receives light from the light source 102. Apreamplifier 126 amplifies the output of the photosensor 122, so as togenerate a detection signal that indicates the amount of received light.The lighting circuit 120 drives the light source 102 based on at leastthe output of the preamplifier 126. For example, the photosensor isarranged so as to receive light that has passed through a slit 105 or apinhole formed in the reflector 104.

For example, the photosensor 122 is provided in order to detect anabnormality. Upon detection of an abnormality as a result of signalprocessing performed on the detection signal, the lighting circuit 120stops the driving operation for the light source 102. Alternatively, thephotosensor 122 may be provided in order to provide a feedback controloperation for controlling the light amount supplied by the light source102. With such an arrangement, the lighting circuit 120 may control thedriving current to be supplied to the light source 102 according to thedetection signal.

The photosensor 122 and the preamplifier 126 are mounted on a sub-basemember 128 that is separate from a base member on which the lightingcircuit 120 is mounted. The sub-base member 128 may be configured as aprinted circuit board. Also, the sub-base member 128 may be configuredas a metal substrate or a flexible printed circuit board.

The sub-base member 128 and the lighting circuit 120 are coupled via asignal line 130 via which a signal S10 that corresponds to the output ofthe preamplifier 126 is transmitted, and a power supply line 132 viawhich the power supply voltage V_(DD) is supplied from the lightingcircuit 120 to the sub-base member 128. Furthermore, the sub-base member128 and the lighting circuit 120 are coupled via a ground line 134 suchthat a common ground electric potential is shared by the sub-base member128 and the lighting circuit 120. It should be noted that a metal memberof the vehicular lighting device 100 may be employed instead of such aground line 134.

The above is the configuration of the vehicular lighting device 100.With the vehicular lighting device 100, by mounting the photosensor 122and the preamplifier 126 on the same sub-base member 128 such that theyare arranged in the vicinity of each other, such an arrangement allowsthe signal S10 that corresponds to the amplified detection signal orotherwise a signal that corresponds to the detection signal to betransmitted to the lighting circuit 120 via wiring (a signal line 130).That is to say, such an arrangement transmits a signal having a largeamplitude via wiring instead of transmitting a weak signal output fromthe photosensor 122. Thus, such an arrangement provides improved noiseresistance, thereby providing improved detection precision.

The present invention encompasses various arrangements derived withreference to FIG. 13 and based on the aforementioned description.Description will be made below regarding specific examples.

Example 1

As with the light source 10 shown in FIG. 3, the light source 102 mainlyincludes a laser diode 12, a phosphor 14, an optical system 16, and ahousing 18. The light source 102 outputs output light 24 having aspectrum as shown in FIG. 4. With such an example, the photosensor 122is employed in order to detect an abnormality in the light source 102having the configuration shown in FIG. 3.

FIG. 14 is a circuit diagram showing an abnormality detector 30 caccording to an example 1. The abnormality detector 30 c receives a partof the output light 24, so as to judge the presence or absence of anabnormality in the light source 10, and more specifically, to judge thepresence or absence of an abnormality in the phosphor 14. Examples ofsuch an abnormality in the phosphor 14 include a crack in the phosphor14, the phosphor 14 falling away from the housing, aging degradation,and the like. However, the abnormality is not particularly restricted inkind.

The abnormality detector 30 c includes a first photosensor 32, a secondphotosensor 34, a first preamplifier 36, a second preamplifier 38, and ajudgment unit 40. The first photosensor 32 is configured to be sensitiveto the wavelength of the excitation light 20, and to be substantiallyinsensitive to the wavelength of the fluorescent light 22. The firstphotosensor 32 receives a part of the output light 24, and generates afirst current I_(SC1) that corresponds to the intensity of theexcitation light 20 after it passes through the phosphor 14. Incontrast, the second photosensor 34 is configured to be sensitive to thewavelength of the fluorescent light 22, and to be insensitive to thewavelength of the excitation light 20. The second photosensor 34receives a part of the output light 24, and generates a second currentI_(SC2) that corresponds to the intensity of the fluorescent light 22emitted from the phosphor 14.

The first photosensor 32 includes a first photodiode PD1 and a firstcolor filter CF1. The first color filter CF1 is configured to have ahigh transmittance for blue light that matches the wavelength of theexcitation light 20, and to have a low transmittance for the wavelengthof the fluorescent light 22. The second photosensor 34 includes a secondphotodiode PD2 and a second color filter CF2. The second color filterCF2 is configured to have a high transmittance for a wavelength rangefrom green to red that matches the wavelength range of the fluorescentlight 22, and to have a low transmittance for blue light. As the firstcolor filter CF1, a blue filter may be employed. As the second colorfilter CF2, a yellow filter, a green filter, or otherwise a red filtermay be employed.

It should be noted the first photosensor 32 and the second photosensor34 may each be provided with a suitable wavelength-dependentsensitivity, i.e., suitable wavelength selectivity, by designing thesemiconductor material that forms the photosensor or by designing thedevice structure of the photosensor instead of designing the colorfilter. Also, the first photosensor 32 and the second photosensor 34 arenot particularly restricted in kind. Rather, various kinds ofsemiconductor photosensors may be employed, examples of which includephotodiodes, phototransistors, CMOS sensors, CCD sensors, and the like.

The first preamplifier 36 includes a first operational amplifier OA1 anda first resistor R1 arranged on a path of the first current I_(SC1), andoutputs a first detection signal V1 that corresponds to a voltage dropV_(SC1) across the first resistor R1. The first detection signal V1changes linearly according to the first current I_(SC1) with a slopethat corresponds to the resistance value of the first resistor R1.

The second preamplifier 38 includes a second resistor R2 arranged on apath of the second current I_(SC2), and outputs a second detectionsignal V2 that corresponds to a voltage drop V_(SC2) across the secondresistor R2. The second detection signal V2 changes linearly accordingto the second current I_(SC2) with a slope that corresponds to theresistance value of the second resistor R2.

The judgement unit 40 judges the presence or absence of an abnormalitybased on the first detection signal V1 and the second detection signalV2. Upon detection of an abnormality, the judgment unit 40 asserts (setsto the high level, for example) an abnormality detection signal S1.

Specifically, the first preamplifier 36 includes the first operationalamplifier OA1 in addition to the first resistor R1. The firstoperational amplifier OA1 is arranged such that its inverting inputterminal (−) is coupled to the first photosensor 32, and a fixed voltageis applied to its non-inverting input terminal (+). The fixed voltage isconfigured as the ground voltage, for example. The first resistor R1 isarranged between the non-inverting input terminal (+) and the outputterminal of the first operational amplifier OA1.

More specifically, the inverting input terminal (−) of the firstoperational amplifier OA1 is coupled to the cathode of the firstphotodiode PD1 of the first photosensor 32. A fixed voltage (groundvoltage) is applied to the anode of the first photodiode PD1.

The voltage level of the first detection voltage V1 generated by thefirst preamplifier 36 is represented by the following Expression (8).

V1=R1×I _(SC1)  (8)

The second preamplifier circuit 38 has the same configuration as that ofthe first preamplifier 36, including a second operational amplifier OA2in addition to the second resistor R2. The voltage level of the outputV2 is represented by the following Expression (9).

V2=R2×I _(SC2)  (9)

The judgment unit 40 includes a voltage comparator CMP1 that makes acomparison between the first detection signal V1 and the seconddetection signal V2. When V1<V2, i.e., when the phosphor 14 operatesnormally, an abnormality detection signal S1 output from the voltagecomparator CMP1 is set to the low level (negated). Conversely, whenV1>V2, i.e., when there is an abnormality in the phosphor 14, theabnormality detection signal S1 is set to the high level (asserted).

The above is the basic configuration of the abnormality detector 30 c.Next, description will be made regarding the operation mechanismthereof.

The first detection signal V1 changes linearly according to the lightamount of the excitation light 20 with a slope determined according tothe resistance value of the first resistor R1. Similarly, the seconddetection signal V2 changes linearly according to the light amount ofthe fluorescent light 22 with a slope determined according to theresistance value of the second resistor R2. With such an arrangement,when the phosphor 14 operates normally, there is a proportional relationbetween the intensity of the excitation light 20, the intensity of thefluorescent light 22, and the intensity of the output light 24 emittedfrom the light source 10. Accordingly, when the phosphor 14 operatesnormally, the ratio between the first detection signal V1 and the seconddetection signal V2 exhibits a substantially constant value. Incontrast, when the excitation light 20 is directly emitted due to theoccurrence of an abnormality in the phosphor 14, the intensity ratiobetween the excitation light 20 and the fluorescent light 22 included inthe output light 24 deviates from that in the normal state, leading to achange in the ratio between the first detection signal V1 and the seconddetection signal V2. With the abnormality detector 30 c shown in FIG.14, by appropriately designing the resistance values of the firstresistor R1 and the second resistor R2, and by monitoring the firstdetection signal V1 and the second detection signal V2, such anarrangement is capable of detecting, in a simple and sure manner, anabnormality that can occur in the phosphor 14 regardless of theintensity of the white light, i.e., regardless of the output level ofthe light source.

FIG. 5A is a diagram showing the relation between the output lightintensity, the first detection signal V1, and the second detectionsignal V2, when the phosphor 14 operates normally. FIG. 5B is a diagramshowing the relation between the output light intensity, the firstdetection signal V1, and the second detection signal V2, when there isan abnormality in the phosphor 14. The mechanism of the abnormalitydetection is the same as that described with reference to FIG. 4.

FIG. 15 is a perspective view showing the abnormality detector 30 cshown in FIG. 14. The first photosensor 32 and the second photosensor 34shown in FIG. 14 correspond to the photosensor 122 shown in FIG. 13. Thefirst preamplifier 36 and the second preamplifier 38 correspond to thepreamplifier 126 shown in FIG. 13.

The components of the abnormality detector 30 c are mounted on thesub-base member 128. The sub-base member 128 is provided with aconnector 140, which allows it to be coupled to the lighting circuit 120via a cable 142. The cable 142 includes the signal line 130, the powersupply line 132, and the ground line 134, as described above. Anoperational amplifier IC 136 includes the first operational amplifierOA1 and the second operational amplifier OA2. An operational amplifierIC 138 includes the voltage comparator CMP1. Also, a capacitor may bearranged in parallel with the first resistor R1 and with the secondresistor R2.

Such an example configuration allows the operational amplifier IC 136 tobe arranged in the vicinity of the first photodiode PD1 and the secondphotodiode PD2, thereby providing improved noise resistance. Inaddition, by mounting the voltage comparator CMP1 on the sub-base member128, such an arrangement allows the abnormality detection signal S1 tobe transmitted in the form of a digital binary signal via the signalline 130 included in the cable 142. Thus, such an arrangement providesfurther improved noise resistance.

The abnormality detector 30 c shown in FIG. 14 can be configured in theform of a small-scale circuit comprising a pair of photodiodes, a pairof operational amplifiers, a pair of resistors, and a single comparator.In addition, the first preamplifier 36 has a current/voltage conversiongain (transimpedance) that depends on only the first resistor R1.Furthermore, the second preamplifier 38 has a current/voltage conversiongain that depends on only the the second resistor R2. Such anarrangement allows the effects of variation in the circuit elements tobe reduced, thereby providing high-precision abnormality detection.

With the first preamplifier 36 shown in FIG. 14, by virtually groundingthe first operational amplifier OA1, the ground voltage is applied toeach of the anode and the cathode of the first photodiode PD1. That isto say, the voltage difference between the anode and the cathode of thefirst photodiode PD1 is set to substantially zero. Such an arrangementis capable of detecting light over a wide light amount range withoutreceiving the effects of dark current. The same can be said of thesecond preamplifier 38.

Example 2

FIG. 16 is a circuit diagram showing an abnormality detector 30 daccording to an example 2. With such an example, the first preamplifier36 and the second preamplifier 38 are each configured as an invertingamplifier. All the components of the abnormality detector 30 d aremounted on the sub-base member 128.

The first preamplifier 36 includes a first operational amplifier OA21arranged such that its inverting input terminal (−) is coupled to ananode of the first photodiode PD1, its non-inverting input terminal (+)is coupled to a cathode of the first photodiode PD1, and a predeterminedfixed voltage is applied to its non-inverting input terminal (+). Forexample, the fixed voltage may be configured as the power supply voltageV_(CC). Also, the fixed voltage may be set to other voltage levels.

The voltage level of the first detection voltage V21 generated by thefirst preamplifier 36 shown in FIG. 16 is represented by the followingExpression (10)

V21=V _(CC) −R1×I _(SC1)  (10)

The second preamplifier 38 is configured in the same manner as the firstpreamplifier 36. The voltage level of the output V22 is represented bythe following Expression (11).

V22=V _(CC) −R2×I _(SC2)  (11)

Description will be made again with reference to FIGS. 7A and 7B. FIG.7A is a diagram showing the relation between the output light intensity,the first detection signal V21, and the second detection signal V22,when the phosphor 14 operates normally. FIG. 7B is a diagram showing therelation between the output light intensity, the first detection signalV21, and the second detection signal V22, when there is an abnormalityin the phosphor 14. As described above, the resistance values of theresistors R1 and R2 are designed such that the relation expressions (1)and (2) hold true. Accordingly, when the phosphor 14 operates normally,the relation V21>V22 holds true. Conversely, when there is anabnormality, the relation V22<V21 holds true. When V21>V22, i.e., whenthe phosphor 14 operates normally, the voltage comparator CMP21 shown inFIG. 16 sets the abnormality detection signal S1 to the low level(signal negation). Conversely, when V21<V22, i.e., when there is anabnormality, the voltage comparator CMP21 sets the abnormality detectionsignal S1 to the high level (signal assertion).

As shown in FIGS. 7A and 7B, when the output light intensity is small,such an arrangement provides the detection currents I_(SC1) and I_(SC2)each having a small value. In this case, there is only a smalldifference between the first detection voltage V21 and the seconddetection voltage V22. Accordingly, in a case in which there isnon-negligible noise, circuit element variation, operational amplifieror voltage comparator offset voltage, or the like (which will bereferred to as “error factors” hereafter), and when the output lightintensity is small, in some cases, the magnitude relation between thefirst detection voltage V21 and the second detection voltage V22 iswrongly reversed, which leads to a problem of false detection of anabnormality. Alternatively, in some cases, such an arrangement is notable to detect an abnormality even when there actually is anabnormality, which is also a problem. As can be clearly understood withreference to FIG. 5, such a problem can occur in the example 1 shown inFIG. 14.

In order to solve such a problem, a judgment unit 40 b offsets at leastone of the first detection voltage V21 and the second detection voltageV22 so as to increase the difference between them. The judgement unit 40b judges the presence or absence of an abnormality based on the offsetdetection voltages V21 and V22.

A phosphor abnormality detection circuit 42 includes a voltage dividingcircuit 43 in addition to the voltage comparator CMP21. The voltagedividing circuit 43 comprising resistors R3 and R4 divides the seconddetection voltage V22. The voltage comparator CMP21 compares the seconddetection signal V32 thus divided with the first detection signal V21,so as to generate the abnormality detection signal S1 a.

Description will be made again referring to FIG. 10. FIG. 10 is adiagram showing the relation between the output light intensity, thefirst detection voltage V21, and the second detection voltage V22 in acase of employing the phosphor abnormality detection circuit 42 shown inFIG. 16 when the phosphor 14 operates normally. With the phosphorabnormality detection circuit 42, the second detection voltage V32 aftervoltage division is represented by the following Expression (12).

$\begin{matrix}\begin{matrix}{{V\; 32} = {R\; {4/( {{R\; 3} + {R\; 4}} )} \times V\; 22}} \\{= {{R\; {4/( {{R\; 3} + {R\; 4}} )} \times V_{CC}} -}} \\{{R\; {4/( {{R\; 3} + {R\; 4}} )} \times R\; 2 \times I_{{SC}\; 2}}}\end{matrix} & (12)\end{matrix}$

That is to say, the y-intercept of the second detection signal V32 shownin FIG. 10 is offset so as to increase the difference in the y-interceptbetween the first detection signal V21 and the second detection voltageV32. The offset width ΔV is represented by V_(CC)×R3/(R3+R4). That is tosay, the offset width ΔV can be adjusted by means of the resistors R3and R4. For example, description will be made assuming that the offsetvoltage of the voltage comparator CMP21 acts as a dominant error factor.In this case, the offset width ΔV is preferably set to a value (e.g., 20mV) that is slightly larger than the offset voltage of the voltagecomparator CMP21.

Such an embodiment provides improved detection precision even when theoutput light intensity is small. In particular, such an arrangementshown in FIG. 16 requires only two resistors R3 and R4 included in thevoltage dividing circuit 43. Thus, such an arrangement requires only alow cost and a small circuit area to provide improved detectionprecision.

Furthermore, as described above, in a case of employing such a voltagedividing circuit 43, such an arrangement provides the divided seconddetection voltage V32 having a slope with an absolute value that issmaller than the absolute value in a case in which such a voltagedividing circuit 43 is not employed. Accordingly, in a range A in whichthe output light has a sufficiently large intensity, the offset width ΔVprovided by the voltage dividing circuit 43 has a sufficiently smalleffect as compared with a range in which the output light has a smallintensity. Thus, such an arrangement has only a negligible effect on thedetection value.

It can be clearly understood that, by providing such a voltage dividingcircuit 43, and by optimizing the resistance value of the secondresistor R2, such an arrangement allows the slope of the seconddetection voltage V32 and the offset width ΔV to be designedindependently as desired.

The voltage comparator CMP1 of the phosphor abnormality detectioncircuit 42 has an open-collector (open-drain) output configuration. Withsuch an arrangement, when an abnormality is detected, the output of thevoltage comparator CMP1 is set to the low level (V_(GND)). When a normalstate is detected, the output of the voltage comparator CMP1 is set tothe open state (high-impedance state). The judgment unit 40 b shifts thelevel of the detection signal S1 a that can switch between two states,i.e., between the high-impedance level and the V_(GND) level, so as togenerate a detection signal S1 b that can switch between a middle levelV_(MID) and the ground level V_(GND). The judgment unit 40 b outputs thedetection signal S1 b thus generated to the lighting circuit 120.

A first level shift circuit 46 a is arranged as a downstream stage ofthe phosphor abnormality detection circuit 42. When the output of thevoltage comparator CMP1 is set to the high-impedance state, the basevoltage of the transistor Tr1 is represented by Vb1=V_(CC)×R8/(R7+R8).With such an arrangement, the first level shift circuit 46 a outputs theemitter voltage (Ve1=Vb1−Vbe) of the transistor Tr1 as the abnormalitydetection signal S1 b having the middle level V_(MID). A resistor R9 anda capacitor C3 are provided in order to protect the circuit from staticelectricity.

When the output of the voltage comparator CMP1 is set to the low levelV_(GN)Dr, the transistor Tr1 is turned off, which sets the emitter ofthe transistor Tr1 to the high-impedance state. The emitter of thetransistor Tr1 is pulled down by a reception circuit of the lightingcircuit 120 side. As a result, the output S1 b of the first level shiftcircuit 46 a is set to the low level V_(GND).

By providing the level shift circuit 46 a, the abnormality detectionsignal S1 b, which can be switched between two levels, is transmitted inthe form of either the middle level V_(MID) or otherwise one from amongthe high level or the low level (V_(GND) in this example), instead ofbeing transmitted in the form of either the high level or otherwise thelow level. When the lighting circuit 120 receives the abnormalitydetection signal S1 b having the middle level V_(MID), the lightingcircuit 120 instructs the light source 10 to operate normally. When theabnormality detection signal S1 b deviates from the middle levelV_(MID), the lighting circuit 120 executes a suitable protectionoperation such as turning off the light source 10.

That is to say, in the signal design for the abnormality detectionsignal S1 b, the asserted level that indicates an abnormality isassigned to the middle level V_(MID), which cannot occur when anabnormality such as an open-circuit fault, a short-circuit fault, or thelike has occurred. Furthermore, the negated level that indicates thenormal state is assigned to the voltage level that can occur when suchan abnormality has occurred. Such an arrangement is capable of executinga suitable protection operation even when a short-circuit fault or anopen-circuit fault has occurred in the line via which the abnormalitydetection signal S1 a is to be transmitted, in addition to when theabnormality detection signal S1 a indicates an abnormality (when theabnormality detection signal S1 a is asserted).

The judgment unit 40 b further includes a COD (catastrophic opticaldamage) detection circuit 44. COD represents a malfunction that occursin the laser diode 12 involving drastic degradation of the output lightamount without change in the electrical characteristics.

The COD detection circuit 44 compares the output V22 of the secondpreamplifier 38 with the threshold voltage V_(THH). When V22<V_(THH),the COD detection circuit 44 generates a COD detection signal S2 a setto the high-impedance state. Conversely, when V22>V_(THH), the CODdetection circuit 44 generates the COD detection signal S2 a set to thelow level V_(GND). If a non-light-emission state has occurred in thelight source 10 due to the occurrence of the COD, the current that flowsthrough the second photodiode PD2 becomes substantially zero, which setsthe second detection signal V22 to the power supply voltage V_(CC)level. Accordingly, by setting the threshold voltage V_(THH) to a valuein the vicinity of the power supply voltage V_(CC), the COD detectioncircuit 44 is capable of detecting such a COD.

A second level shift circuit 46 b has the same configuration as that ofthe first level shift circuit 46 a. The level shift circuit 46 b shiftsthe level of an output S2 a of the COD detection circuit 44 so as togenerate a COD detection signal S2 b that can switch between a middlelevel V_(MID) and the ground level V_(GND).

FIG. 17 is a circuit diagram showing a reception circuit. A receptioncircuit 80 is mounted on the lighting circuit 120. The reception circuit80 receives the abnormality detection signal S1 b from the abnormalitydetector 30 d shown in FIG. 16 via the signal line 130. The receptioncircuit 80 mainly includes transistors Tr3 through Tr5 and resistors R13and R14. A capacitor C5 is provided in order to protect the circuit fromelectromagnetic noise. The resistor R13 is provided in order to secure acontact current.

When the abnormality detection signal S1 b is set to the middle levelV_(MID) (≈2.8 V) that indicates the normal state, the transistors Tr3and Tr4 are turned on, and the transistor Tr5 is turned on. In thiscase, the output Sic of the reception circuit 80 is set to the low-levelvoltage V_(GND) that indicates the normal state.

When the abnormality detection signal S1 b is set to the ground voltageV_(GND) that indicates an abnormality, the transistors Tr3 and Tr4remain turned on, and the transistor Tr5 is turned off. In this case,the output Sic of the reception circuit 80 is set to the high-levelvoltage V_(CC) that indicates the occurrence of an abnormality.

If the signal line 130 is short-circuited to the power supply voltageline, the transistors Tr3 and Tr4 are turned off. In this case, theoutput Sic of the reception circuit 80 is set to the high-level voltageV_(CC), which is the same as that in a case in which the abnormalitydetection signal S1 b indicates an abnormality. If the signal line 130is short-circuited to the ground line, the abnormality detection signalS1 b is set to the same value as that of the ground voltage V_(GND). Inthis case, the output Sic of the reception circuit 80 is set to thehigh-level voltage V_(CC) that indicates the occurrence of anabnormality.

As described above, with the reception circuit 80 shown in FIG. 17, whenthe reception circuit 80 receives an input signal having the middlelevel V_(MID), the reception circuit 80 generates the signal Sic havingthe first level (V_(GND)). When the reception circuit 80 receives aninput signal having other levels (the power supply voltage V_(CC) orotherwise the ground voltage V_(GND)) that differ from the middle levelV_(MID), the reception circuit 80 generates the signal Sic having thesecond level (V_(CC)). Also, the reception circuit for receiving the CODdetection signal S2 b may be configured in the same manner.

Description has been made above regarding an aspect of the presentinvention with reference to the third embodiment. The above-describedthird embodiment has been described for exemplary purposes only, and isby no means intended to be interpreted restrictively. Rather, it can bereadily conceived by those skilled in this art that variousmodifications may be made by making various combinations of theaforementioned components or processes, which are also encompassed inthe technical scope of the present invention. Description will be madebelow regarding such modifications.

Fifth Modification

FIG. 18 is a circuit diagram showing an abnormality detector 30 eaccording to a fifth modification. Description has been made withreference to FIG. 16 regarding an arrangement in which the abnormalitydetector 30 d is configured to transmit two abnormality detectionsignals S1 b and S2 b in a parallel manner via two signal lines 130. Incontrast, with the abnormality detector 30 e shown in FIG. 18, multipleabnormality detection signals are multiplexed by means of logicaloperation into a single abnormality detection signal, which istransmitted via a single signal line 130.

A logic gate 48 generates the logical OR of the output S1 a of thephosphor abnormality detection circuit 42 and the output S2 b of the CODdetection circuit 44. For example, the logic gate 48 includes a pair ofdiodes D1 and D2 arranged such that their anodes are coupled so as toform a common anode. In a case in which the outputs of the voltagecomparators CMP1 and CMP2 can switch between two levels, i.e., betweenthe high level and the low level, the logic gate 48 may be configured asan OR gate. The level shift circuit 46 may have the same configurationas that of the first level shift circuit 46 a described above.

When at least one from among the abnormality detection signal S1 a andS1 b is set to the low level V_(GND) that indicates an abnormality, thebase voltage of the transistor Tr1 falls, which turns off the transistorTr1. As a result, the abnormality detection signal S1 is set to the lowlevel V_(GND).

When the abnormality detection signals S1 a and S1 b are all set to thehigh-impedance state that indicates the normal state, the base voltageVb1 of the transistor Tr1 rises. In this case, the emitter electricpotential Ve1 of the transistor Tr1 is set to (Vb1−Vbe). In this state,the abnormality detection signal S1 is set to the middle voltage V_(MID)level.

With the abnormality detector 30 e shown in FIG. 18, such an arrangementallows the number of signal lines to be reduced. Such an abnormalitydetector 30 e is effectively applicable to a case in which there is noneed to identify the kind of factor that has caused the occurrence of anabnormality.

Sixth Modification

Description has been made with reference to FIGS. 14, 16, and 18regarding an arrangement configured to transmit the abnormalitydetection signal S1 that can switch between two states. However, thepresent invention is not restricted to such an arrangement. For example,the judgment unit 40 may be mounted on the main circuit board on thelighting circuit 120 side. With such an arrangement, the outputs of thefirst preamplifier 36 and the second preamplifier 38 may be respectivelytransmitted via the respective signal lines.

Seventh Modification

Description has been made in the embodiment regarding an arrangement inwhich the judgment unit 40 is configured as the voltage comparator CMP1.However, the present invention is not restricted to such an arrangement.For example, after the first detection signal V1 and the seconddetection signal V2 are respectively converted into digital values D1and D1 by means of an A/D converter, the judgment unit 40 may performsignal processing on the digital values D1 and D2 thus converted, so asto judge the presence or absence of an abnormality. In this case, thefirst preamplifier 36, the second preamplifier 38, and the A/D convertermay be mounted on the sub-base member 128, and the judgement unit 40 maybe mounted on a main circuit board. Also, the judgment unit 40 may bemounted on the sub-base member 128.

Eighth Modification

The method for providing the offset width ΔV described above withreference to FIG. 16 is not restricted to such a voltage dividingcircuit 43. For example, the voltage comparator CMP1 may be configuredto be capable of adjusting the input offset voltage. With such anarrangement, at least one from among the first detection signal V1 andthe second detection signal V2 may be offset. Such an arrangement iscapable of preventing false detection of an abnormality due to errorfactors such as noise or the like.

Ninth Modification

With the abnormality detector 30 c shown in FIG. 14, at least one fromamong the first detection signal V1 and the second detection signal V2may be offset, which is also effective as a modification. Specifically,the second detection signal V2 shown in FIG. 5A may be offset toward thepositive electric potential side. In order to provide such a function, afixed voltage that corresponds to the offset width ΔV may preferably beapplied to the non-inverting input terminal (+) of the first operationalamplifier OA1.

Lastly, description will be made regarding the usage of the vehicularlighting device 1. FIG. 19 is a perspective view of a lamp unit (lampassembly) 500 including the vehicular lighting device 1 according to theembodiment. The lamp unit 500 includes a transparent cover 502, ahigh-beam unit 504, a low-beam unit 506, and a housing 508. Theaforementioned vehicular lighting device 1 may be employed as thehigh-beam unit 504, for example. The vehicular lighting device 1includes one or multiple light sources 10. The vehicular lighting device1 may be configured as the low-beam unit 506 instead of or in additionto being configured as the high-beam unit 504.

Description has been made regarding the present invention with referenceto the embodiments using specific terms. However, the above-describedembodiments show only the mechanisms and applications of the presentinvention for exemplary purposes only, and are by no means intended tobe interpreted restrictively. Rather, various modifications and variouschanges in the layout can be made without departing from the spirit andscope of the present invention defined in appended claims.

1.-8. (canceled)
 9. A vehicular lighting device comprising: a lightsource; a photosensor structured to receive light from the light source;a preamplifier structured to amplify an output of the photosensor, so asto generate a detection signal that indicates an amount of receivedlight; and a lighting circuit structured to drive the light source basedon at least the output of the preamplifier; wherein the photosensor andthe preamplifier are mounted on a single sub-base member that isseparate from a base member on which the lighting circuit is mounted,and the sub-base member and the lighting circuit are coupled via asignal line via which a signal that corresponds to the output of thepreamplifier is transmitted, and via a power supply line via which apower supply voltage is supplied from the lighting circuit to thesub-base member.
 10. The vehicular lighting device according to claim 9,the photosensor being used to detect an abnormality in the light source,wherein the vehicular lighting device further comprises a judgment unitmounted on the sub-base member, and structured to generate anabnormality detection signal that indicates the presence or absence ofan abnormality in the light source based on the detection signal. 11.The vehicular lighting device according to claim 10, wherein: when theabnormality detection signal indicates a normal state, the abnormalitydetection signal is set to an electric potential level determinedbetween a power supply voltage and a ground voltage; and wherein whenthe abnormality detection signal indicates an abnormal normal state, theabnormality detection signal is set to the power supply voltage orotherwise the ground voltage.
 12. The vehicular lighting deviceaccording to claim 9, further comprising a reflector structured toreflect light emitted from the light source, wherein the photosensor isarranged to receive light after it passes through a slit or otherwise apinhole formed in the reflector.
 13. A vehicular lighting devicecomprising: a light source furnished with a laser diode structured toemit excitation light and a phosphor structured to emit fluorescentlight by undergoing excition by the excitation light, and that isstructured to generate white output light containing the excitationlight and fluorescent light spectra; a lighting circuit structured todrive the light source; a first photosensor structured to be sensitiveto the excitation light's wavelength and to be substantially insensitiveto the fluorescent light's wavelength, and to receive a part of theoutput light so as to generate a first current that corresponds to anamount of received light; a second photosensor structured to besensitive to the fluorescent light's wavelength, to be substantiallyinsensitive to the excitation light's wavelength, and to receive a partof the output light so as to generate a second current that correspondsto an amount of received light; a first preamplifier comprising a firstoperational amplifier and a first resistor arranged in a path of thefirst current, and structured to output a first detection signal thatcorresponds to a voltage drop across the first resistor; a secondpreamplifier comprising a second operational amplifier and a secondresistor arranged in a path of the second current, and structured tooutput a second detection signal that corresponds to a voltage dropacross the second resistor; and a judgement unit structured to judge thepresence or absence of an abnormality in the light source based on thefirst detection signal and the second detection signal; wherein thefirst photosensor, the second photosensor, the first preamplifier, andthe second preamplifier are mounted on a single sub-base member that isseparate from a base member on which the lighting circuit is mounted.14. The vehicular lighting device according to claim 13, wherein thejudgment unit is mounted on the sub-base member.